The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1986
Filed:
Mar. 12, 1982
Applicant:
Inventors:
Yuh-Geng Tsay, San Jose, CA (US);
Vipin D Shah, Saratoga, CA (US);
Assignee:
International Immunoassay Laboratories, Inc., Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
424-11 ; 436500 ; 436504 ; 436517 ; 436518 ; 436542 ; 436804 ;
Abstract
An improved radioimmunoassay test method and device based upon competitive binding test methods wherein immunoreactions are halted at a time when the rate of change of the quantity of bound radiolabeled analyte of interest is inversely proportional to the concentration of analyte of interest in an unknown sera. Based thereon, a test device is created having a single calibration curve 36 which is accurate throughout the shelf life of the device.