The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 1986

Filed:

Mar. 20, 1985
Applicant:
Inventors:

Mikio Hongo, Yokohama, JP;

Katsurou Mizukoshi, Yokohama, JP;

Tateoki Miyauchi, Yokohama, JP;

Takao Kawanabe, Tokorozawa, JP;

Yasuhiro Koizumi, Sayama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D / ; C23C / ; C23C / ;
U.S. Cl.
CPC ...
427 531 ; 118 501 ; 118720 ; 118725 ; 2191 / ; 346 / ; 346108 ; 427142 ; 430-5 ; 430945 ;
Abstract

A photo-mask is mounted on a repairing chamber, with its mask pattern forming surface being exposed to the interior of the chamber. Vaporized repairing material which includes a metallic element is introduced into the chamber, and a laser beam is projected from the exterior of the chamber onto a transparent defect of the mask pattern. The irradiated portion is heated and the vaporized repairing material at the heated portion is resolved, resulting in the metal resolved from the repairing material deposits and fills the transparent defect. Thus, transparent defects of a mask pattern can be repaired in a simplified process.


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