The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 1986

Filed:

Apr. 09, 1984
Applicant:
Inventor:

William E Humphrey, San Leandro, CA (US);

Assignee:

Humphrey Instruments Incorporated, San Leandro, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; A61B / ;
U.S. Cl.
CPC ...
351208 ; 354 62 ;
Abstract

A method for use with an eye examination instrument for automatically aligning the eye under examination with the instrument optical axis. An operator initially aligns the instrument optical axis manually with the eye under examination. A first adjustment to the initial alignment is then automatically made in the optical train of the instrument so as to laterally align the eye under examination. The size of the lateral adjustment is determined, and an axial adjustment of the optical train is automatically effected by an amount controlled by the size of the lateral adjustment so as to axially align the eye under examination, whereby the requisite axial adjustment is determined directly from the accomplished lateral adjustment without the need for intervention of the operator.


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