The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 1986
Filed:
Feb. 01, 1983
Hiroyoshi Matsumura, Saitama, JP;
Toshio Katsuyama, Hachioji, JP;
Norio Ohta, Sayama, JP;
Tsuneo Suganuma, Tokorozawa, JP;
Kazuyuki Nagatsuma, Hachioji, JP;
Yutaka Sugita, Tokorozawa, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A measuring instrument of magnetic field utilizing Faraday rotation is disclosed in which a medium exhibiting Faraday rotation includes at least one thin magnetic garnet film magnetized in a propagation direction of light and having a composition expressed by a general formula R.sub.3-x Q.sub.x (Fe.sub.5-y M.sub.y)O.sub.12 (where R indicates at least one element selected from a group consisting of Y, La, Lu, Ca, Sm and Bi, Q indicates at least one element selected from a group consisting of Gd, Eu, Er, Tm, Tb, Yb, Ho and Dy, M is at least one element selected from a group consisting of Ga, Al, Ge, Si, Sc, Mn, In, V and Cr, the value of x lies in a range expressed by a formula 0.1.ltoreq.x.ltoreq.3.0, and the value of y lies in a range expressed by a formula 0.ltoreq.y.ltoreq.5.0). According to this instrument, stable measured values are obtained independently of temperature variation.