The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 1986
Filed:
Jul. 22, 1985
Arthur Evans, Brookfield Center, CT (US);
Wentworth Laboratories, Inc., Brookfield, CT (US);
Abstract
A test probe assembly for checking an integrated circuit chip before terminal leads are applied to the contacts thereof which are deployed on the chip in a common plane. The assembly includes a planar insulation card provided with a port and having a printed circuit thereon whose traces are connected to a plurality of test terminals connectable to external testing equipment. Surrounding the port and bonded to the card is a mounting ring of dielectric material having a flat face on which is supported a radial array of fine wires lying in a horizontal plane. These are maintained in their assigned positions by a layer of dielectric material adherent to the face, the wires being embedded in the layer. The wires cantilever across the port and converge toward the central region thereof below which is disposed the chip to be tested, the tapered leading end of each wire being double bent to define a needle having a shank section and a tip section terminating in a tip which engages a respective contact on the chip. The tip section has a downward slope whereby the tips of the needles are exposed to view through a microscope for purposes of alignment. The trailing end of each wire is soldered to a respective trace connecting each needle to a test terminal.