The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 1986

Filed:

Oct. 17, 1984
Applicant:
Inventors:

Shigenobu Akiyama, Hirakata, JP;

Yasuaki Terui, Neyagawa, JP;

Shin-ichi Ogawa, Katano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; C30B / ;
U.S. Cl.
CPC ...
148-15 ; 29571 ; 2957 / ; 2957 / ; 2957 / ; 148175 ; 148187 ; 357 231 ; 357 91 ;
Abstract

A method of obtaining a multilayer semiconductor device by forming a semiconductor crystallized layer through an insulative material over a semiconductor substrate in which a semiconductor device is formed. The insulative material is formed on the semiconductor substrate in which the semiconductor device is fabricated and a first semiconductor layer is formed on the insulative material. Thereafter, the surface of the first semiconductor layer is planarized and an insulative material is formed on this planarized surface, then a second semiconductor layer is formed on this insulative material. Next, the second semiconductor layer is crystallized by the irradiation of an energy beam, thereby fabricating a device in the second crystallized semiconductor layer.


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