The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1986

Filed:

Feb. 29, 1984
Applicant:
Inventor:

Katsushige Tsuno, Tokyo, JP;

Assignee:

Jeol Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K / ; H01J / ;
U.S. Cl.
CPC ...
2503 / ;
Abstract

A transmission electron microscope having objective lens comprising upper, middle and lower magnetic pole pieces installed inside a yoke enveloping the first and second excitation coils. The polarity of the first magnetic field between the upper and middle magnetic pole piece is changed according to the selection of the two observation modes for an electron microscope image and for a converged beam diffraction pattern. However, the position of a specimen located at the midst of the second magnetic field between the middle and lower magnetic pole pieces is fixed during said two operation modes, so that analysis for a crystalline material of a very small area in the specimen is carried out by easy operation.


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