The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 1986
Filed:
Oct. 26, 1983
Kazuyuki Nagatsuma, Hachioji, JP;
Hiroyoshi Matsumura, Saitaka, JP;
Tsuneo Suganuma, Tokorozawa, JP;
Norio Ohta, Sayama, JP;
Keikichi Ando, Musashino, JP;
Yuzuru Hosoe, Hachioji, JP;
Yutaka Sugita, Tokorozawa, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Cable, Ltd., Tokyo, JP;
Abstract
In a magnetic-field measuring apparatus having a Faraday rotation property, a medium having the Faraday rotation property includes at least one magnetic garnet thin film having a composition represented by a general formula of R.sub.3 (Fe.sub.5-x M.sub.x)O.sub.12 (where R is at least one element selected from a group consisting of La, Sm, Lu, Ca and Bi, or at least two elements selected from the group with Y being added thereto, M is at least one element selected from a group consisting of Ga, Ge, Al, Si, Sc, In and Cr, and a range of x is 0.ltoreq.x.ltoreq.1.5), and magnetized in a direction of light transmission, whereby an overall temperature characteristic of a ratio (4.pi.Ms/Ho) of a saturation flux density 4.pi.Ms to a collapse field Ho of a strip domain of the thin film is improved. The magnetic-field measuring apparatus offers a stable measurement of magnetic-field irrespective of a temperature change.