The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1986
Filed:
Nov. 19, 1982
Michael A Mihalik, Beaverton, OR (US);
Gerd H Hoeren, Lake Oswego, OR (US);
Michael G Reiney, Tigard, OR (US);
James J Besemer, Portland, OR (US);
Steven R Palmquist, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
An apparatus for time aligning data acquired by one test instrument with corresponding data acquired by another test instrument is disclosed. A set of binary codes, representative of a set of instructions executed by a microprocessor disposed within a user's prototype circuit, are acquired by said one test instrument. With the acquisition of each of said binary codes, a count is developed in a counter indicative of each said acquisition. A multitude of binary data is acquired, independently of the acquisition of the set of binary codes, by said another test instrument, the multitude of binary data being representative of the functions performed by a set of components present within said user's prototype circuit. The binary codes acquired by said one test instrument and the binary data acquired by said another test instrument each have associated therewith a count developed from said counter. A mini-computer receives the binary codes acquired by said one test instrument, the binary data acquired by said another test instrument, and the counts corresponding thereto. The mini-computer time-aligns the binary data acquired by said another test instrument with the binary codes acquired by said one test instrument, using the counts associated therewith. A display of the time-aligned data is developed on a display device. As a result, when an instruction is executed by the microprocessor of the user's prototype circuit, using said display, it is possible to easily analyze the activity which took place among the components present within the user's prototype circuit as a result of the execution of said instruction by said microprocessor.