The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 1986
Filed:
Jun. 07, 1984
Hirohide Miwa, Kawasaki, JP;
Hajime Hayashi, Yamato, JP;
Takai Shimura, Machida, JP;
Tadahiko Yanashima, Fujisawa, JP;
Kenji Kawabe, Yokohama, JP;
Atsuo Iida, Yokohama, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
An ultrasonic sector-scan probe comprises at least an array having a plurality of ultrasonic transducer segments, a window for transmitting and receiving ultrasonic waves and an ultrasonic wave propagation medium filled in a front space between the array and the window. A group of the ultrasonic transducer segments are selectively driven as an aperture and ultrasonic waves emitted therefrom are converged into a beam for transmission and reception. By partly or entirely changing the segments in the group with the ones outside the group the scan line is shifted to a new angle, and a member under test contacted with the window on the outside thereof is sector-scanned by the ultrasonic beam. The array is arranged so that scanning lines of the groups intersect at one point in the window or in its vicinity for sector scan. And an acoustic lens is provided in the window or in its vicinity so that the ultrasonic beam may be converged almost over the measuring depth range of the member under test with/without phase control of the segments in the group. Furthermore, the array is arranged multidimensionally or in plural linear arrays so that the scanning lines of the groups intersect substantially at one point in the window or in its vicinity for sector scan, thereby performing sector scan of at least two sections and/or three-dimensional sector scan.