The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 1986

Filed:

Jan. 26, 1984
Applicant:
Inventors:

S Sheffield Eaton, Jr, Colorado Springs, CO (US);

Cheng-Cheng Hu, Colorado Springs, CO (US);

Assignee:

Inmos Corporation, Colorado Springs, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
2957 / ; 29571 ; 2957 / ; 148-15 ; 148187 ; 148D / ; 357 44 ; 357 51 ;
Abstract

An improved semiconductor structure and the method for fabricating such is disclosed. The invention relates to the use of thick-oxide for improved field-shield isolation especially as applied to dynamic RAMS's and also to its integration into an improved CMOS process. The improved structure has increased isolation characteristics between adjacent memory cells and still allows for lessened spacing between cells. The corresponding process determines the spacing between cells through etching and eliminates several steps by utilizing one mask for several purposes including defining the active transistor areas and the first polysilicon layer and by extending the use of the first polysilicon layer for field-shield isolation between cells. Additional advantages are disclosed including a higher body effect in the isolation transistors, use of a nitride dielectric layer, and a higher, stable threshold voltage in the isolation transistors. Also, modification of the improved process for fabrication of P-channel and N-channel devices can be made.


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