The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1986

Filed:

Sep. 12, 1984
Applicant:
Inventors:

Bantval J Baliga, Clifton Park, NY (US);

Peter V Gray, Scotia, NY (US);

Robert P Love, Schenectady, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
29571 ; 29578 ; 29580 ; 357 22 ; 148187 ;
Abstract

An improved semiconductor device having a diffused region of reduced length and an improved method of fabricating such a semiconductor device are disclosed. The semiconductor device may be a MOSFET or an IGR, by way of example. In a form of the method of fabricating a MOSFET, an N.sup.+ SOURCE is diffused into a P BASE through a window of a diffusion mask. An anisotropic or directional etchant is applied to the N.sup.+ SOURCE through the same window. The etchant removes most of the N.sup.+ SOURCE, but allows shoulders thereof to remain intact. These shoulders, which form the completed N.sup.+ SOURCE regions, are of reduced length, greatly reducing the risk of turn-on of a parasitic bipolar transistor in the MOSFET. The risk of turn-on of a parasitic bipolar transistor in an IGR is similarly reduced, when the IGR is fabricated by the improved method.


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