The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 1985

Filed:

Sep. 06, 1983
Applicant:
Inventor:

Kai Y Chan, Milpitas, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G04F / ;
U.S. Cl.
CPC ...
368118 ; 368120 ; 324 / ;
Abstract

Method and apparatus are provided for measuring the settling time, relative to a reference time, of an analog signal having a varying amplitude. The apparatus includes a pair of comparators U1 and U2 for comparing the amplitude of the analog signal with first and second reference signals V.sub.Ref 1 and V.sub.Ref 2. The comparators U1 and U2 are connected to edge detector 22 which supplies a reset signal to a second counter 26 whenever the amplitude of the analog signal is not between the first and second reference signals. Oscillator 32 drives counters 25 and 26 which count pulses from oscillator beginning at the reference time and continuing until the second counter 26 contains a predetermined count. Because the second counter 26 is reset by the edge detector 22 whenever the analog waveform exceeds either of the reference signals, the difference between counter 25 and counter 26 at any subsequent time after the waveform has settled will be the settling time of the analog waveform.


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