The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1985
Filed:
Dec. 06, 1982
Applicant:
Inventor:
Michael G Reiney, Tigard, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G06F / ;
U.S. Cl.
CPC ...
371 25 ; 371 26 ;
Abstract
A circuit test system using signature analysis allows random probing to detect faults in an assembly under test. Test points on a properly working assembly are probed at random and the signatures obtained are listed in a memory or storage media. Thereafter, when testing other boards these same test points are probed randomly and the signatures are compared to the list of possible good signatures. If a match is found a 'pass' indication is generated and the operator tests another node. If a match is not found, a 'failure' indication is generated and more detailed troubleshooting of circuits at that test node commences.