The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1985
Filed:
Apr. 07, 1983
Katsushige Tsuno, Akishimashi, JP;
Toshikazu Honda, Akishimashi, JP;
JEOL Ltd., Tokyo, JP;
Abstract
In an electron microscope, having intermediate lenses between the object and the projection lenses, the first and second intermediate lenses are used for rotating the final electron microscope image without changes in magnification. The desired angle signal indicating to azimuth angle .theta. is designated by an operator. The absolute magnetomotive force .vertline.J1.vertline. and .vertline.J2.vertline. of the first and second intermediate lenses are controlled by a lens control means in the relation that (.vertline.J1.vertline.-.vertline.J2.vertline.) is proportional to the azimuth angle .theta. and (.vertline.J1.vertline.+.vertline.J2.vertline.) is nearly proportional to the square of the azimuth angle .theta..