The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 1984
Filed:
Jan. 19, 1982
Hiroyuki Takeda, Hiroshima, JP;
Kunio Kudo, Sendai, JP;
Izumi Kobayashi, Higashikurume, JP;
Yohsuke Ojiri, Kasugai, JP;
Mitsuyuki Oda, Tokyo, JP;
Sakae Sugiyama, Tohkai, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In ultrasonic flaw inspection for determining the size of a flaw by emitting an ultrasonic wave to a subject via a probe and receiving an ultrasonic echo from said flaw existing inside said subject, changes in the propagation distances of the ultrasonic echoes before and after movement of said probe through a micro-small distance are compared with each other and the ultrasonic echoes are determined to result from the same flaw if the change width falls within a predetermined value determined by the angle of incidence of the ultrasonic wave and the directional angle.