The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 1984
Filed:
Jul. 28, 1981
Freund Industrial Co., Ltd., Tokyo, JP;
Abstract
Method of and apparatus for testing required properties of the specimen solids such as tablets, pills, granules, capsules, etc. automatically and continuously. After nondestructive tests are performed, then destructive tests are performed automatically and continuously. The data obtained by the tests can be processed to record and display the processed data. The nondestructive tests comprise at least one of the tests of the weight, diameter, thickness, color difference, and surface area, etc. which are performed in order or simultaneously. The destructive tests comprise at least one of the tests of the hardness, disintegration, dissolution, abrasion and chemical analysis. The apparatus consists of supply a mechanism for supplying the solids, nondestructive test mechanisms, destructive test mechanisms and a system for transferring solids from one test position to the next test position.