The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 1984

Filed:

Apr. 01, 1983
Applicant:
Inventors:

Anthony J Hoeg, Jr, Cary, NC (US);

Charles T Kroll, Raleigh, NC (US);

Geoffrey B Stephens, Cary, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
29571 ; 29578 ; 2957 / ; 148-15 ; 357 23 ; 357 59 ; 357 92 ;
Abstract

A process for placing non-continuous Dual Electron Injection Structures (DEIS) between two layers of polysilicon used to form an array of poly devices on an integrated circuit substrate. Separate masks are used to define Poly 1 and Poly 2 devices, respectively. The DEIS structure is disposed above the poly 1 devices. A silicon nitride (Si.sub.3 N.sub.4) layer is used to mask the DEIS structure and prevents it from oxidizing during certain processing steps. A thin layer of poly x is placed between the DEIS structure and the Si.sub.3 N.sub.4. The poly x layer forms a buffer and protects the DEIS during an etching step which removes the Si.sub.3 N.sub.4 layer.


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