The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 1984

Filed:

Jun. 07, 1982
Applicant:
Inventors:

David W Williams, Baltimore, MD (US);

James R Cricchi, Catonsville, MD (US);

Assignee:

Westinghouse Electric Corp., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
2957 / ; 29571 ; 148-15 ; 148187 ; 357 23 ; 357 91 ;
Abstract

A method is described for positioning the variable threshold region of a memory transistor by a predetermined distance from the drain and source regions. The method includes providing openings in the dielectric material over the substrate at the same time or in one mask step for the variable threshold region and the drain and source regions. A mask is positioned over the variable threshold region opening at times the drain and source regions are formed. The variable threshold region is subsequently formed by growing thin oxide and a layer of nitride thereover. Both sides of the variable threshold region have a fixed threshold region between the respective drain and source which is controlled by a common gate electrode. The invention overcomes the problem of providing additional space for alignment tolerances between the variable threshold region and the drain and source regions.


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