The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 1984
Filed:
Jan. 22, 1982
G Samuel Hurst, Oak Ridge, TN (US);
James E Parks, Oak Ridge, TN (US);
Harold W Schmitt, Oak Ridge, TN (US);
Atom Sciences, Inc., Oak Ridge, TN (US);
Abstract
Apparatus and method are described for the quantitative analysis of a specific specie within a sample. The analysis has sufficient sensitivity for the detection of as little as one atom of the desired species. The method is accomplished by bombarding a sample with a highly focused charged particle beam; for example, a beam of positive argon ions having an energy from five to thirty kilovolts and a current of one milliampere or greater. This beam impinging upon the sample creates a cloud including secondary ions and neutral particles of the constituents of the sample. The cloud is irradiated with a laser beam having selected wavelengths therein for the unique ionization of the desired specie by means of resonance ionization spectroscopy (RIS). In most applications some energy and/or mass discrimination is required. The energy discrimination can be accomplished by passing the RIS ions through an energy filter, with the ions emanating therefrom having a narrow range of energy. Then, if desired, a mass discrimination may be accomplished in an appropriate mass analyzer such as a time of flight spectrometer, an r.f. quadrupole mass spectrometer or a magnetic sector mass spectrometer.