The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 1984

Filed:

Jul. 26, 1982
Applicant:
Inventors:

Stanley H Kravitz, Coopersburg, PA (US);

Ajit S Manocha, Allentown, PA (US);

William E Willenbrock, Jr, Manchester Township, Ocean County, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
156643 ; 156646 ; 156657 ; 156662 ; 2041 / ; 252 791 ;
Abstract

The manufacture of VLSI devices is facilitated by a method for chlorine reactive sputter etching of silicon materials in a plasma reactor that has been passivated by a previous etching operation involving a fluorine-containing gas. The passivated reactor is reactivated for chlorine reactive sputter etching by the generation of a boron trichloride plasma in the reactor. In the preferred embodiment, a mixture of boron trichloride and chlorine is used to initiate the etching of the silicon material before pure chlorine is used to complete the etch. The invention permits silicon materials to be etched in a reactor in which chlorine and fluorine-containing gases are used sequentially.


Find Patent Forward Citations

Loading…