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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 4409676 B1

PDFFull Text
Date of Patent:
Oct. 11, 1983

Filed:

Feb. 19, 1981

Method and means for diagnostic testing of ccd memories

Applicant:
Inventor:

Ramesh C Varshney, San Jose, CA (US);

Assignee:

Fairchild Camera & Instrument Corporation, Mountain View, CA (US);

Attorneys:

Olsen; Kenneth

Pollock; Michael J.

Silverman; Carl L.

Primary Examiner:

Stuart N Hecker

Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 3241 / ;
Abstract

Diagnostic testing of a charge coupled device is facilitated by interconnecting the reference node of the sense amplifier for each data block in the CCD device with a probe contact on the device, thereby eliminating the need for applying a microprobe to the sensitive reference node. Reference voltages under different operating conditions can be evaluated by measuring the device generated reference voltage or by applying variable reference voltages through the probe contact to the reference node.

Find Patent Forward Citations

Varshney, Ramesh. (1983). Method and means for diagnostic testing of ccd memories (U.S. Patent No. 4409676). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4409676

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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