The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 1983

Filed:

Oct. 13, 1981
Applicant:
Inventors:

Makoto Takeuchi, Akishimashi, JP;

Ekuo Yoshida, Akishimashi, JP;

Masahiro Kohno, Akishimashi, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 63 ; 422 64 ; 436173 ; 436808 ;
Abstract

A spin immunoassay apparatus includes means for sampling one of a plurality of sample solutions, a system for measuring certain amounts of the sample solution, a reaction system for mixing the sample solution with reagent which consists of antibody coupled with spin labelled antigen by antigen-antibody reaction and incubating the mixture for a certain period of time, and an electron spin resonance device for measuring the concentration of a spin labelled material extricated. The electron spin resonance device has a cavity resonator including a fixed cell. A flow system transfers the mixed sample solution and reagent into the cell. The intensity of a magnetic field applied to the cell is adjusted so that the maximum differential value or the minimum differential value of the ESR signal of the spin labelled material will be detected.


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