The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 1983

Filed:

Jun. 05, 1981
Applicant:
Inventors:

Elsa Reichmanis, Piscataway, NJ (US);

Bernard J Roman, Summit, NJ (US);

King L Tai, Berkeley Heights, NJ (US);

Cletus W Wilkins, Jr, Plainfield, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C / ; G03C / ;
U.S. Cl.
CPC ...
430312 ; 430156 ; 430313 ; 430315 ; 430323 ; 430324 ; 430394 ; 430396 ; 430273 ; 430502 ; 430503 ;
Abstract

High-resolution patterning of a device surface is effected by a method which involves the use of a multi-layer resist structure. An organic resist layer is on the surface to be patterned, and an inorganic resist layer is on the organic resist layer. A pattern is produced in the inorganic layer by exposure to actinic radiation and, after development of the inorganic layer, the pattern is replicated in the organic layer by additional exposure to actinic radiation. The pattern is then developed in the organic layer so as to leave exposed surface portions to be affected by a fabrication agent.


Find Patent Forward Citations

Reichmanis, Elsa. (1983). Multiple exposure microlithography patterning method (U.S. Patent No. 4373018). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4373018

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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