The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 1983

Filed:

Sep. 09, 1981
Applicant:
Inventor:

James C Sternberg, Fullerton, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356338 ; 356244 ; 356427 ; 356440 ; 435291 ;
Abstract

Photometric analysis apparatus having a cylindrical glass sample container which is rotated about its axis during optical measurement of sample in the container. Rotation of the 5 container window areas past an optical detector compensates for optical variations and imperfections in the container wall which would otherwise render the measured photometric signal sensitive to each particular rotational orientation of the container.


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