The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 1983

Filed:

Nov. 10, 1980
Applicant:
Inventors:

Kenji Kimura, Saitama, JP;

Kohji Ishikawa, Funabashi, JP;

Naoaki Narumi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 21 ; 324 / ; 371 25 ; 371 27 ;
Abstract

A semiconductor memory test equipment which reads out a memory under test by an address from a pattern generator and compares the read-out data with an expected value by a comparator, and in which a block mask memory is read out by a portion of the address and the comparing operation of the comparator is inhibited by block mask data read out from the block mask memory. Pattern data for a pattern memory, which is read out by the abovesaid address to store data to be supplied to the comparator, are transferred as parallel data from a central processor and written in the pattern memory after conversion to serial data, and serial data read out from a defective address memory are inputted to the central processor after conversion to parallel data.


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