The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1982

Filed:

Jun. 02, 1980
Applicant:
Inventor:

Keith A Taylor, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
328165 ; 328111 ; 307234 ; 307520 ;
Abstract

A glitch detector for use in a sampled data acquisition system is disclosed. Glitch detection is provided by a flip-flop which is set on a first signal transition, conditioning a logic gate, the output of which changes logic states on a second signal transition. Two such glitch detectors operatively associated with complementary data signals permits detection of either positive-going or negative-going glitches within a sample clock period. A glitch indication flip-flop is reset by a glitch detection signal, providing a glitch indication signal to an output terminal via a latch. Control and reset circuits are provided to facilitate glitch detection on every cycle of the sample clock, and at any point within a sample clock period.


Find Patent Forward Citations

Taylor, Keith. (1982). Glitch detector (U.S. Patent No. 4353032). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4353032

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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