The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1982

Filed:

May. 27, 1980
Applicant:
Inventors:

Horst Stegmann, Dresden, DD;

Wolfgang Meyl, Dresden, DD;

Peter Hentschel, Dresden, DD;

Assignee:

Jenoptik Jena GmbH, Jena, DD;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01W / ;
U.S. Cl.
CPC ...
7317 / ; 3327 / ;
Abstract

A measuring arrangement is described for determining the terrestrial refraction in geodetic measurements, (such as trigonometric height transfers when staking out and for precision tachymetry, controlling devices for building machinery using a laser beam, and precision levelling). The measuring arrangement includes a geodetic measuring instrument, an electronic calculator and a device for measuring differences of travel times of soundwaves. After the soundwaves produced by a sound emitter have traversed representative airlayers (for instance at different heights), the time difference is measured and is used for calculating the refraction.


Find Patent Forward Citations

Loading…