The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 1982

Filed:

Nov. 19, 1979
Applicant:
Inventors:

Toshitaka Fukushima, Yokohama, JP;

Kazumi Koyama, Kanagawa, JP;

Kouji Ueno, Yokohama, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
371 21 ;
Abstract

A field programmable device having a memory cell member including regular bit lines, regular word lines, regular memory cells connected at the cross points of said regular bit lines and regular word lines, test bit or test word lines, and non-conductive and conductive test memory cells connected at the cross points of said regular bit or regular word lines and test word or test bit lines, wherein the conductivity of a test memory cell is determined by the '1' or '0' of the address signal by which the test word or test bit line to which the test memory cell is connected is selected.


Find Patent Forward Citations

Fukushima, Toshitaka. (1982). Field programmable device having test provisions for fault detection (U.S. Patent No. 4320507). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4320507

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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