The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 26, 1982
Filed:
Jul. 05, 1979
Kyuichi Shibasaki, Yokosuka, JP;
Toyo Seikan Kaisha, Ltd., Tokyo, JP;
Abstract
An internal pressure inspecting method and system for determining the degree of unevenness of the surface of an elastic cover of each of one or more hermetically sealed containers, the unevenness being produced according to the internal pressure. The distance from a fixed position exterior of the hermetically sealed container to said cover surface is determined by measuring the change in inductance utilizing the action of electromagnetic induction, at a plurality of points i.e. the center and peripheral portions thereof. A value is derived by calculation of the difference between a mean value of both measured values at any one point in the peripheral portion and at the position on the diametric line which is in symmetrical relation therewith with the center of the container cover as the center of symmetry, and the measured value at the center of the container cover. The internal pressure of said hermetically sealed container is determined from this value.