The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1981

Filed:

Sep. 27, 1979
Applicant:
Inventors:

Thomas R Skopek, Somerville, MA (US);

Howard L Liber, Brookline, MA (US);

Bruce W Penman, Cambridge, MA (US);

William G Thilly, Cambridge, MA (US);

Henry Hoppe, IV, Arlington, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ; C12Q / ; C12N / ;
U.S. Cl.
CPC ...
435-6 ; 435 29 ; 435241 ;
Abstract

An assay is disclosed for determining mutagenic damage caused by the administration of a known or suspected mutagen to diploid human lymphoblastoid cell lines. The gene locus employed for this assay is the gene for thymidine kinase, uridine kinase, or cytidine deaminase. Since human lymphoblastoid cells contain two genes for these enzymes, heterozygotes of human lymphoblastoid cells are used in this assay.


Find Patent Forward Citations

Skopek, Thomas. (1981). Assay for mutagenesis in heterozygous diploid human lymphoblasts (U.S. Patent No. 4302535). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4302535

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…