The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1981
Filed:
Dec. 26, 1979
Applicant:
Inventors:
Shinji Aoki, Tokyo, JP;
Keita Kawamura, Fujisawa, JP;
Tsutomu Higo, Chigasaki, JP;
Hitoshi Kimura, Fujisawa, JP;
Yasuhiro Sawada, Fuchu, JP;
Tsutomu Katayama, Kitakyushu, JP;
Katsumi Kengaku, Kitakyushu, JP;
Assignees:
Ebara Corp., Tokyo, JP;
Shin Nippon Seitetsu Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73 493 ; 73 40 ; 73 407 ;
Abstract
A method of detecting a broken foil that closes the opening of the window of the reaction vessel of an apparatus for treating waste gas with irradiation is disclosed. The detection is accomplished by monitoring a change in the window cooling gas.
Aoki, Shinji. (1981). Method of detecting broken window foil of apparatus for treating waste (U.S. Patent No. 4283937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4283937
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile