The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 1980
Filed:
Dec. 18, 1978
Applicant:
Inventors:
Tadao Yamamoto, Machida, JP;
Hiroshi Takekawa, Kunitachi, JP;
Taichi Banno, Hachioji, JP;
Kiyozo Koshiishi, Sagamihara, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
204 / ; 422 63 ; 422 64 ; 422 72 ; 422 98 ;
Abstract
In the disclosed method, ion activity is measured by placing a cup filled with a test solution to be measured on a cup receiver, lifting a cup lifting arm to engage the cup receiver with a rotary plate, rotating the rotary plate to stir the test solution in the cup, measuring a potential difference between a reference electrode and other electrodes after completion of the stirring of the solution, and indicating the ion activity as a function of the potential differences.