The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 1979
Filed:
Sep. 27, 1977
Masaru Ito, Kodaira, JP;
Seiichi Murayama, Kokubunji, JP;
Manabu Yamamoto, Odawara, JP;
Kounosuke Ohishi, Mito, JP;
Hitachi, Ltd., , JP;
Abstract
This application discloses a spectrophotometer employing a magneto-optic effect which enables quantitative analysis of a sample to be measured by a double beam method. In performing the double beam method for analyzing the sample, a magnetic field is applied to the sample along with linearly polarized light from a light source, the forward scattered light scattered by the sample atoms and the incident linearly polarized light from the sample are converted into two cross-polarized beams of light using an analyzer, and these two beams of cross-polarized light are spectrally analyzed by a single dispersive element. The spectrophotometer of the invention provides an arrangement such that the plane defined by the above-mentioned two beams of light is perpendicular to the plane of dispersion of the dispersive element, and the two beams of light so dispersed are independently detected by separate detectors.