The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 1979

Filed:

Jan. 16, 1978
Applicant:
Inventor:

Walter R Curtice, West Windsor, NJ (US);

Assignee:

RCA Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; H03K / ;
U.S. Cl.
CPC ...
235 / ; 235 / ; 235 / ; 235 / ; 235 / ; 324187 ; 364569 ;
Abstract

The interval between arrival of two time displaced signals is measured with a resolution less than 0.5 nanoseconds by electronic vernier techniques utilizing transferred electron logic device circuits. The first arriving signal triggers a first clock generator of pulse period T.sub.C, the pulses from which are counted by a first counter and a second counter. The second arriving signal triggers a second clock pulse generator having a pulse period T.sub.V, the first pulse therefrom disabling the first counter at a count of M. As T.sub.V <T.sub.C coincidence of the pulses from the two clock pulse generators will eventually occur causing disabling of the second counter at a count of N. Time interval .DELTA.T is computed from the formula: .DELTA.T=(N-1)T.sub.C -(N-M)T.sub.V.


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Curtice, Walter. (1979). Time interval measurement (U.S. Patent No. 4165459). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4165459

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