The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1978

Filed:

Oct. 20, 1976
Applicant:
Inventors:

Manfred Pfeiler, Erlangen, DT;

Kurt Dietz, Erlangen, DT;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ; H05G / ;
U.S. Cl.
CPC ...
250322 ; 250408 ; 250409 ;
Abstract

The organ-related keys for selecting radiographic exposure parameters according to a predetermined programming may include special correction keys to be actuated according to an estimate of patient transparency, or in any event the keys representing respective organs imply a range of expected attenuations of the incident radiation due to the presence of the patient. The disclosed system senses the implied patient transparency range from the setting of the control keys, and compares the same with an actual value signal due to the specific patient and takes suitable control action in the event that patient bulk does not fall within the predetermined range. For example, the control action may comprise a shut off of the radiation source, or a change of X-ray tube high voltage setting or of anode current. It is also possible for the system to automatically store data on the parameters selected such as the geometry of the camera and/or the X-ray film in service, and to utilize such data to improve the accuracy of the transparency actual value signal, or to aid in determining the response to be made by the system to detected discrepancies.


Find Patent Forward Citations

Loading…