The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 16, 1978
Filed:
Mar. 10, 1976
William J Alexander, Verona, PA (US);
Solid State Measurements, Inc., Monroeville, PA (US);
Abstract
A system is provided for measuring excess carrier lifetime in semiconductor devices. A series of rectangular current pulses is applied to the device to be tested, and the slope of the open-circuit voltage decay curve following termination of each pulse is observed. The slope of the curve is determined at a predetermined voltage level by means of voltage comparators which produce an output pulse having a width indicating the time interval required for the open-circuit voltage to decay from a preset level to a lower preset level. The excess carrier lifetime is determined from the slope of the voltage decay curve, and is visually displayed in microseconds in a digital display. Provision is also made for observing the voltage decay curve on an oscilloscope.