The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 1977
Filed:
May. 12, 1976
Egon Bussmann, Munich, DT;
Bruno Flamme, Neuried, DT;
Jacky Vanhumbeeck, Brugge, BE;
Johannes Helder, Brugge, BE;
Hubert De Steur, Drongen, BE;
Siemens Aktiengesellschaft, Berlin & Munich, DT;
Abstract
A process control system for metal depositing baths for monitoring the chemical composition of a bath liquid provides that, in the event of a deviation of a component of the bath liquid from a reference value, the bath liquid is regenerated by supplying correcting liquid to the bath. The system includes an automatically operating analyzer which is connected to a measured value adjusting device which, in dependence upon the difference established between a reference value and an actual value of the bath liquid component subject to analysis, controls the supply of the correcting liquid to the bath. A common process control system for a plurality of galvanic baths includes a main programmer, a bath selection programmer and analysis programmers which can be selectively connected by the selection programmer, and which in accordance with the individual components of the bath liquid which is to be analyzed, actuate specific analyzer sections of the analyzer where each measured value adjusting device which is connected to an analyzer section will, in the case of a difference in measured value, control the supply of the correct quantity of the specific correcting liquid to the particular bath which is subject to analysis.