The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 1977
Filed:
Mar. 13, 1975
Rainer Rolle, Randburg, Transvaal, ZA;
Ortec Incorporated, Oak Ridge, TN (US);
Abstract
The invention provides a method and apparatus for determining the concentration of an element such as a heavy metal in a matrix of a material such as rock by the X-ray or gamma-ray fluorescence technique. It allows the use of this technique where a sample to be analyzed has a rough or jagged surface. The effect of the rough surface is eliminated by adjusting the distance between the source and/or detector from the sample so that the rate of detection of radiation in a reference energy band is maintained constant for all samples, including reference samples used for calibration. The reference band is at least partly outside the band or bands characteristic of the element sought.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile