The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 1977
Filed:
Apr. 09, 1975
David E Harris, Columbus, OH (US);
Robert M Watson, Columbus, OH (US);
John D Redmyer, Columbus, OH (US);
Autech Corporation, Worthington, OH (US);
Abstract
A non-contact optical gauging device in which a laser beam is deflected to produce a bidirectional scan. The beam is split; a measuring portion scans an object being inspected while the other portion scans a calibration reticle having alternating opaque and transparent bands. The alternating transmission and ocultation of the beam through the reticle is used to generate calibration pulses, each representing a predetermined increment of movement of the calibration beam. Ocultation of the measuring beam by the object being measured generates a signal which is used to control counting of the calibration pulses as an indication of the dimension being measured. Bidirectional averaging is employed to minimize errors due to object motion in the direction of beam scanning. Variations are disclosed in which two measuring beams and one or two calibration beams, are employed for measuring large objects or for dual axis measurement, the latter by orthogonal projection onto the object being measured.