The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 1977
Filed:
Dec. 05, 1975
Robert George Knollenberg, Boulder, CO (US);
Robert E Luehr, Boulder, CO (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
Method and apparatus for establishing a valid sample volume in a beam of radiation, wherein a sample stream is introduced substantially transversely to the radiation beam, an optical system is configured to produce images on first and second image planes, the two planes preferably being perpendicular to one another and established by means of a beam splitter, first and second photosensors being positioned in the image planes, the first photosensor having greater optical and an electronic gain and a masked portion, and the second photosensor being either unmasked or having masked portions corresponding generally to the unmasked portions of the first photosensor, the first photosensor being connected to comparator means and the second photosensor also being connected to the comparator means which accepts data only when the signal from second photosensor is of a greater magnitude than the signal from the first photosensor, whereby images on the photosensors from points outside the selected sample volume will be oriented with a sufficient portion of the image on the unmasked section of the first photosensor to produce a signal greater than that produced by the second photosensor thus rejecting data from that event.