The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 1976
Filed:
Mar. 13, 1975
Applicant:
Inventor:
Brooks E Cowart, Mountain View, CA (US);
Assignee:
Fairchild Camera and Instrument Corporation, Mountain View, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 3241 / ; 3241 / ;
Abstract
A tester for conducting parametric tests on semiconductor devices comprises a current source means to be electrically coupled to a particular lead of the device under test to supply the maximum current specified to be drawn by said lead at a fixed voltage, a voltage maintenance means electrically coupled to the lead to maintain the lead at the specified voltage and a current direction-sensing means electrically coupled between the lead and the voltage maintenance means to detect the direction of current flow to determine whether the lead draws more or less current than the constant current.