The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 1976

Filed:

Apr. 08, 1974
Applicant:
Inventors:

Harvey H Wacks, Southfield, MI (US);

Peter H Klose, Troy, MI (US);

Stanford R Ovshinsky, Bloomfield Hills, MI (US);

Robert W Hallman, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ; G03B / ;
U.S. Cl.
CPC ...
355 19 ; 355 64 ; 355 99 ;
Abstract

A dry-process method and apparatus for producing archival microform records from light reflecting hard copy utilize a dry-process mask film strip which is photosensitive to and microimaged by light reflected and reduced or condensed from the hard copy and developed by heat to provide microimaged transparencies therein as the mask film strip is moved to an imaging and developing station. It also utilizes a dry-process microform film which has archival properties and which is sensitive to and microimaged and developed by short pulses of electromagnetic energy above a threshold value applied thereto through the microimaged transparencies of the superimposed mask film strip when it is moved to an image transferring station to provide in the microform film imaged microform records which conform to the transparent microimages in the dry-process mask film strip and, hence, the hard copy and which have achival properties. The microform film is preferably in the form of a microfiche.


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