The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Sep. 30, 2022
Applicant:

Intel Foundry Ip Llc, Santa Clara, CA (US);

Inventors:

Xiao Wen, Beaverton, OR (US);

Dipto Thakurta, Portland, OR (US);

Sairam Subramanian, Portland, OR (US);

David Sanchez, Portland, OR (US);

Amit Paliwal, Hillsboro, OR (US);

Assignee:

Intel Foundry IP LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10P 74/00 (2026.01); G01R 31/52 (2020.01); G01R 31/54 (2020.01);
U.S. Cl.
CPC ...
H10P 74/273 (2026.01); G01R 31/52 (2020.01); G01R 31/54 (2020.01);
Abstract

Embodiments disclosed herein include an apparatus for alignment detection. In an embodiment, the apparatus comprises a substrate, and a plurality of devices on the substrate, where each of the plurality of devices comprises a process monitor structure with different offsets from a target value. In an embodiment, a plurality of electrically conductive traces are on the substrate, where each of the plurality of electrically conductive traces has a first end and a second end opposite the first end, and where each of the plurality of electrically conductive traces is electrically coupled at the first end, respectively, with each of the plurality of devices. In an embodiment, the second end of the each of the plurality of electrical traces is within a scan area on the substrate, and where the each of the plurality of electrically conductive traces are not directly electrically coupled with each other.


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Wen, Xiao. (2026). Voltage contrast process monitor (U.S. Patent No. 12796407). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12796407

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