The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

May. 06, 2025
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Peng Zhang, Los Altos, CA (US);

Yu-Chung Lien, San Jose, CA (US);

Murong Lang, San Jose, CA (US);

Zhenming Zhou, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G06F 2212/7205 (2013.01);
Abstract

Whether a destination block of a memory device is a quad-level cell (QLC) block is determined responsive initiation of a garbage collection operation. Whether a source block of the memory device is a single-level cell (SLC) block is determined responsive to determining that the destination block is a QLC block. The destination block using a first pass-type programming mode with valid data of the source block is programmed during the garbage collection operation responsive to determining that the source block is not a SLC block.


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Zhang, Peng. (2026). Multi-pass programming for garbage collection (U.S. Patent No. 12792508). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12792508

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