The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Mar. 05, 2025
Applicants:

Postech Research and Business Development Foundation, Pohang-si, KR;

Uif (University Industry Foundation), Yonsei University, Seoul, KR;

Inventors:

Ki Hean Kim, Pohang-si, KR;

Jung Bin Lee, Pohang-si, KR;

Su Il Jeon, Pohang-si, KR;

No Seong Park, Pohang-si, KR;

Ji Eun Yun, Pohang-si, KR;

Seong Han Kim, Pohang-si, KR;

Chulmin Joo, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); H04N 23/16 (2023.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G02B 21/0056 (2013.01); H04N 23/16 (2023.01); H04N 23/55 (2023.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
Abstract

Proposed is a microscope enabling differential phase contrast imaging of oblique focal plane and a method for operating the same, which can image a large area 3D surface by scanning and photographing in a horizontal direction a focal plane tilted by applying an oblique plane microscopy (OPM) technology that tilts a focal plane of a photographing area of a microscope. The microscope includes a sample photographing module for photographing a sample and an imaging generator for generating a sample imaging on the basis of an image of the sample photographed in the sample photographing module, wherein the sample photographing module includes a light source unit for radiating light to the sample, an objective lens for obtaining transmitted light from the sample, and an imaging information acquisition unit for obtaining imaging information of the sample through the transmitted light.


Find Patent Forward Citations

Quick Actions:

Kim, Ki. (2026). Microscope enabling differential phase contrast imaging of oblique focal plane and method for operating same (U.S. Patent No. 12791845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791845

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…