The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Dec. 29, 2022
Verisilicon Microelectronics (Shanghai) Co., Ltd., Shanghai, CN;
Xiaoying Chen, Shanghai, CN;
Huiming Zhang, Shanghai, CN;
Kui Qin, Shanghai, CN;
Cheng Chi, Shanghai, CN;
Jianbing Wu, Shanghai, CN;
VeriSilicon Microelectronics (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A segmented testing method for a functional safety testing circuit, an electronic device, and a storage medium are provided. The segmented testing method comprises: analyzing a circuit architecture of the functional safety testing circuit, and determining coverage paths of circuits that require functional safety protection; splitting the functional safety testing circuit to obtain two or more segmented circuits based on the coverage paths; testing each of the segmented circuits to obtain a circuit testing result by using a preset testing mechanism; and determining a functional safety error of the functional safety testing circuit based on the circuit testing result. The above method can be used for end-to-end circuit functional safety protection, thereby reducing the requirements of the system when data is transmitted from the sending terminal to the receiving terminal, and further reducing the complexity of the functional safety system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile