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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12784441 B1

PDFFull Text
Date of Patent:
Nov. 03, 2026

Filed:

Dec. 28, 2021

Deterioration prediction device, deterioration prediction method, and recording medium

Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Chisato Sugawara, Tokyo, JP;

Toshimichi Yokote, Tokyo, JP;

Yosuke Kimura, Tokyo, JP;

Yusuke Mizukoshi, Tokyo, JP;

Takakazu Ishii, Tokyo, JP;

Hiromichi Hirata, Tokyo, JP;

Shouhei Ohno, Tokyo, JP;

Nana Jumonji, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Wesley J Tucker

Int. Cl.
CPC ...
G06V 20/10 (2022.01); G06T 7/00 (2017.01); G06T 7/50 (2017.01); G06T 11/65 (2026.01);
U.S. Cl.
CPC ...
G06V 20/176 (2022.01); G06T 7/0004 (2013.01); G06T 7/50 (2017.01); G06T 11/65 (2026.01); G06T 2207/30132 (2013.01);
Abstract

A deterioration prediction device according to the present disclosure is provided with: a sensor history information acquisition means that acquires sensor history information of a structure; a strata information acquisition means that acquires strata information of the ground under the structure; a deterioration prediction means that predicts the deterioration state of the structure at a future point in time on the basis of the sensor history information and the strata information; and an output means that outputs the deterioration prediction result of the structure.

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Sugawara, Chisato. (2026). Deterioration prediction device, deterioration prediction method, and recording medium (U.S. Patent No. 12784441). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784441

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