The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Jan. 18, 2022
Applicant:

Yamaha Robotics Co., Ltd., Tokyo, JP;

Inventors:

Hirokatsu Muramatsu, Tokyo, JP;

Takuya Adachi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06V 10/46 (2022.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06T 5/50 (2013.01); G06T 7/0008 (2013.01); G06T 7/13 (2017.01); G06V 10/46 (2022.01); G06T 2207/20221 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A three-dimensional diagram generation apparatus () includes a controller () that generates a three-dimensional diagram of a semiconductor device based on an image obtained by imaging the semiconductor device. The controller () acquires a vertical view image and multiple oblique view images of the semiconductor device, extracts a contour line in the vertical view image to generate a vertical view diagram of the semiconductor device, converts the vertical view diagram into multiple oblique view diagrams based on a shape parameter stored in a storage part, repeatedly execute adjustment of the shape parameter and conversion of the vertical view diagram into each oblique view diagram until each converted oblique view diagram overlaps with each oblique view image, and synthesizes the generated vertical view diagram and each oblique view diagram overlapping with each oblique view image to generate the three-dimensional diagram.


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Muramatsu, Hirokatsu. (2026). Method for generating three-dimensional diagram of object, three-dimensional diagram generation apparatus and three-dimensional shape inspection apparatus (U.S. Patent No. 12784345). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784345

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