The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Oct. 14, 2024
International Business Machines Corporation, Armonk, NY (US);
Youngseok Kim, Montvale, NJ (US);
Malcolm Scott Carroll, Cranbury, NJ (US);
David Zajac, Valley Cottage, NY (US);
Abhinav Kandala, Yorktown Heights, NY (US);
Martin O. Sandberg, Ossining, NY (US);
Jiri Stehlik, New York, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Systems, computer program products and/or computer-implemented methods for qubit-TLS environment modulation for quantum error correction (QEC) are provided. A system can comprise a memory that can store computer-executable components and can comprise a processor that executes at least one of the computer executable components that can execute a quantum circuit for QEC that comprises fault-tolerant operation cycles comprising of syndrome measurements; obtain error information from the syndrome measurements or decoded information from a decoder; and modulate, based on the error information and via modulation of a TLS knob, a qubit-TLS environment during execution of the quantum circuit or after execution of a series of the fault-tolerant operation cycles in response to a detection of errors, wherein modulating the qubit-TLS environment during execution comprises modulating the TLS knob with a calibrated time variation, and wherein modulating the qubit-TLS environment after execution comprises post-processing measurement outcomes based on the error information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile